The Second Generation XZIF (Xandex Zero Insertion
Force) Interconnect is the latest innovation in interconnect design by
Xandex.XZIF is changing the direction of test interfacing
by turning contact force on its side, enabling massively parallel test
with ZERO board deflection.
Tunable electrical performance makes
XZIF the ideal solution for both High and Low Speed Digital Test with
a high current carrying capacity that can handle any power
requirement.
Click Here for more information on
the revolutionary XZIF Interconnect and change the direction of YOUR
Test Interface towards the future!