The Second Generation XZIF (Xandex Zero Insertion Force) Interconnect is the latest innovation in interconnect design by Xandex.XZIF is changing the direction of test interfacing by turning contact force on its side, enabling massively parallel test with ZERO board deflection.
Tunable electrical performance makes XZIF the ideal solution for both High and Low Speed Digital Test with a high current carrying capacity that can handle any power requirement.
Click Here for more information on the revolutionary XZIF Interconnect and change the direction of YOUR Test Interface towards the future!